Abstract: The theme of this year’s meeting will largely be focused on imaging-enabled nanoscale research on the structure, properties and processing of materials. Invited speakers will describe new tools and methods for atomic-scale structural and chemical characterization of materials, and application of these methods to optimization of processing and properties of materials for a wide range of applications. Results from imaging-based in situ studies of vapor- and liquid-phase processes for synthesis of nanostructured materials and in situ studies of nano- and micro-scale phenomena that can be used to engineer properties of bulk materials will be presented. Development of compact high-brilliance X-ray sources that can provide synchrotron-level materials analyses with laboratory-scale systems will also be discussed. Studies of nanoscale electronic, photonic, mechanical and catalytic properties of materials will be included and discussion of prospects for development of new state-of-the-art tools and methods for imaging-based and x–ray based materials research will be featured.