Abstract: The theme of this year’s meeting will largely be focused on imaging-enabled nanoscale research on the structure, properties and processing of materials. Invited speakers will describe new tools and methods for atomic-scale structural and chemical characterization of materials, and application of these methods to optimization of processing and properties of materials for a wide range of applications. Results from imaging-based in situ studies of vapor- and liquid-phase processes for synthesis of nanostructured materials and in situ studies of nano- and micro-scale phenomena that can be used to engineer properties of bulk materials will be presented. Development of compact high-brilliance X-ray sources that can provide synchrotron-level materials analyses with laboratory-scale systems will also be discussed. Studies of nanoscale electronic, photonic, mechanical and catalytic properties of materials will be included and discussion of prospects for development of new state-of-the-art tools and methods for imaging-based and x–ray based materials research will be featured.
We are no longer accepting registrations but you are welcome to register in person on the day of the event. Lunch will only be provided to people who pre-registered.